摘要
Duringthelastfewdecades,photothermalradiometry(PTR)hasbeengreatlydevelopedandwidelyappliedinthefieldofnondestructivetesting.However,thetraditionalPTRsystememploysanexpensivelock-inamplifiertodetecttheweakphotothermalsignal,whichleadstohighcostandlongtesttime.Inthispaper,afasttransmissionPTRsystembasedonsamplingbyusinganinternalcomputersoundcardwasdevelopedtolowerthesystemcostandshorterthetesttime.Apieceofamorphoussilicon(a:Si)thinfilmsolarcellswithartificialdefectswaspreparedandtestedbythesystem.Theresultsshowthatthesharpeneddefectscanbeidentifiedeasilyandquicklyaccordingtothesignificantpeaksoftheoriginalinfraredsignalsampledbytheinternalcomputersoundcard.Furthermore,moredetaileddefectscanbeinvestigatedbyprocessingtheinfraredsignal.ThesevalidatetheeffectivenessoftheproposedtransmissionPTRsystemasalowcostandefficientnon-destructivetesttechnique.
出版日期
2015年01月11日（中国期刊网平台首次上网日期，不代表论文的发表时间）
