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2017年12期
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Evaluation of threading dislocation density of strained Ge epitaxial layer by high resolution x-ray diffraction
Evaluation of threading dislocation density of strained Ge epitaxial layer by high resolution x-ray diffraction
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摘要
未填写
DOI
3j7wqzgvd1/1790729
作者
苗渊浩;胡辉勇;李鑫;宋建军;宣荣喜;张鹤鸣
机构地区
不详
出处
《中国物理B:英文版》
2017年12期
关键词
分类
[理学][物理]
出版日期
2017年12月22日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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来源期刊
中国物理B:英文版
2017年12期
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