摘要
AYAGsupershortpulselaser(355nm,35ps)isusedasanexposuresourceandthemicrowavedielectricspectri,techniqueisusedtoquicklydetectthephotoelectrondecayprocessinAgXmicrocrystals,becausethefreephotoelectronlifetimeanddecayprocesscandecidethesensitivityandotherefficienciesofsilverhalidematerial.TheresultshowsthatthefreephotoelectronaveragelifetimesofKodak-100andFuji-100colourfilmsamplesare8.5and9.5ns,respectively.
出版日期
2002年03月13日(中国期刊网平台首次上网日期,不代表论文的发表时间)