首页 > 《半导体光子学与技术：英文版》 > 2001年1期 > Measurement of Composite Film Parameters by a Prism Coupler

Measurement of Composite Film Parameters by a Prism Coupler

在线阅读下载PDF 导出详情

摘要 AnewpolymercompositethinfilmDMACB/PEK-cisreported.Afterpolingofthefilm,therefractiveindicesntandnn,thatisthein-film-planeandthenormal-to-film-planerefractiveindicesat633nmandthethicknessdweredeterminedusingthequasi-waveguidem-linemethod.Theresultsofmeasurementandcalculationare:nt=1.6573±0.0017,nn=1.6278±0.0019,andd=1.4278±0.0031μm.

DOI 34g2k9koj9/1995855

作者 FANYun－zheng;RENQuan

机构地区不详

出处《半导体光子学与技术：英文版》 2001年1期

关键词光学器件参数测量棱形耦合器聚合物复合薄膜

分类 [电子电信][物理电子学]

出版日期 2001年01月11日（中国期刊网平台首次上网日期，不代表论文的发表时间）

相关文献

1TIAN Guojun ZHANG Yufeng ZHANG Yan DU Qiyun XIAO Changfa GUO Hao. STUDY ON THE DESALINATION BEHAVIORS OF PA/PSF THIN FILM COMPOSITE.高分子化学,2006-02.
2GAO Jinzhang LI Shengying YANG Wu ZHAO Guohu BO Lili SONG Li. Preparation and photocatalytic activity of PANI/TiO2 composite film.金属材料,2007-01.
3. Photoacoustic measurement of thermal properties and thickness of buried layers in a multilayer film.声学,1993-04.
4JingtaoLI;QiCHEN;XiangyuanDONG;ShiLIU. Electrical Capacitance Tomography Measurement of Flow Patterns and Film Thickness in a Thermosyphon.物理,2005-01.
5LI Hui;XIE Mingfeng. Measurement of Plasma Parameters of Gliding Arc Driven by the Transverse Magnetic Field.核技术及应用,2012-08.
6T.Liu Y.N.Xie 等. An XAFS measurement of copper thin film by a simple detector in total—electron—yield mode.核技术及应用,2000-01.
7石朝毅;张玉钧;殷高方;赵南京;段静波;余晓娅;肖雪;甘婷婷;方丽;刘文清. Measurement of algae PSII photosynthetic parameters using high-frequency excitation flashes.光学工程,2014-08.
8Soundararajan GNANAVEL;Krishnan BALACHANDRAN. Simultaneous Identification of Two Parameters on the Reaction Diffusion System from Discrete Measurement Data.基础数学,2013-06.
9Ju Fu;Xiao-Hong Tan;Yao-Hua Li;Xin-Jian Song. A nanosilica/exfoliated graphene composite film-modified electrode for sensitive detection of methyl parathion.化学,2016-09.
10Xuanhe Liu;Zhuoyue Li;Nan Gao. An improved wall shear stress measurement technique using sandwiched hot-film sensors.力学,2018-02.

来源期刊

半导体光子学与技术：英文版

半导体光子学与技术：英文版

相关推荐

同分类资源更多

相关关键词

光学器件参数测量棱形耦合器聚合物复合薄膜

返回顶部