简介:简介:AD9433是一种12位单片采样A/D转换器,为模拟器件公司的产品.它具有片上跟踪/保持电路,在设计上追求使用方便.该产品转换速率高达125MSPS,并为适应宽带和高IF载波系统中的突出动态性能做了优化设计.
简介: 简介: AD9709是模似器件公司生产的一种双通道高速8位CMOSD/A转换器,它是双通道TxDAC引脚兼容系列产品的成员之一,该系列器件可提供8、10、12和14位分辩率.AD9709集成了两个高品质8位TxDAC+总核、一个电压基准和数字接口电路,采用48引脚小型LQFP封装.这种D/A转换器可提供特别的ac和dc性能,同时支持达125MSPS速率. ……
简介:Thetomographytechniqueiscommonlyusedforthereconstructionofholographicinterferometry.However,thecurrentreconstructionmethoddoesn'tconsiderthemeasurementerrorswhicharenon-avoidableinthemeasurementandwilldegradethereconstructionquality.Thefactorsaffectingthereconstructionqualityareanalyzedandthedistributionlawofthereconstructionerrorwithexperimentalerrorsisdiscussed.Finally,amethodtoimprovethereconstructionquality—theKalmanfiltermethodispresented.
简介:Inthispaper,anewresult,newformulasoftransferfunctionandinputimpedancefor2-Ddissipativereactancenetworkcascadesynthesisisgivenintermsofsimplifiedformulastorealizedoublyterminatedresistively1-Ddissipativereactancenetworks.Thenewresultincludesthemoregeneralcases,e.g.thebothcanbedissipativeoroneisdissipativeandtheanotherisalosslessreactancesubnetworkandsoon.Twocalculationexamplesaregiveninthepapertoillustratetheaboverealizations.Besides,consideringsomeproblemsofthedirectconnectionbetweentwosubnetworks,wealsointroduceone-waylinestodiscussthecascadesynthesisofnonreciprocal2-Ddissipativereactancenetworks.
简介:Ahigh-speedandhigh-resolutionopticalA/Dquantizerisproposed.Itsarchitectureisdiscussed.Bitcircuitsarebuiltbyusingthephasemodulatorsinparallel.Basedonthedifferentcharacterofthehalf-wavevoltageforeveryphasemodulatorandthepolarizedbiasdesignofincidentlight,theRFinputsignaliscodedandtransmittedintheformofopticaldigitalsignal.Accordingtotheprincipleofthearchitecture,thehigh-resolutionquantizerswith8-bitand12-bit,etal.arebuilt,whichoperateat100GS/s.Theirquantizationnoiseisinvariablealmostwithbitcircuitsincreasing.Thesimulationresultof4-bitA/Dquantizerisalsogiven.
简介:LinearPhaseFIRFilteronMeasuring3-DSurface①WANGYunshan,YANGFujun,LIWei(ShandongUniversityofTechnology,Jinan250061,CHN)Abstract...
简介:Inthispaperweproposeathreedimensionalmultiplierlessdiscretecosinetransform(DCT)withliftingschemecalled3D-binDCT.Basedon3D-binDCT,anovelvideocodingalgorithmwithoutmotionestimation/compensationisproposed.Itusesthe3D-binDCTtoexploitspatialortemporalredundancy.ThecomputationofbinDCTonlyneedsshiftandadditionoperations,thusthecomputationalcomplexityisminimized.DCcoefficientprediction,modifiedscanmodeandarithmeticcodingtechniquesarealsoadopted.Extensivesimulationresultsshowthattheproposedcodingschemeprovideshighercodingefficiencyandimprovesvisualquality,anditiseasytoberealizedbysoftwareandhardware.
简介:Theclosephotogrammetric3-Dcoordinatemeasurementisanewmeasuringtechnologyinthefieldsofthecoordinatemeasurementmachine(CMM)inrecentyears.Inthismethod,weusuallyplacesometargetsonthemeasuredobjectandtakeimageoftargetstodeterminetheobjectcoordinate.Thesubpixellocationoftargetimageplaysanimportantroleinhighaccuracy3-Dcoordinatemeasuringprocedure.Inthispaper,somesubpixellocationmethodsarereviewedandsomefactorswhichaffectlocationprecisionareanalyzed.Thenweproposebilinearinterpolationcentroidalgorithm.Theexperimentshaveshownthisalgorithmcanimproveaccuracyoftargetcentroidbyincreasingavailablepixels.
简介:Byusingthecenterprojectionimagesequencetoestimate3-Dmotionparameters,oneneedstoknowthecorrespondingrelationshipbetweenthefeatureofmotionobjectinspaceandtheprojectioncoordinateonimageplane.Inordertoavoidusingtherelationshipoffeaturecorrespondence,thetensoranalysismethodintheaffinetransformationsystemispresented,andthesimulationdataofexperimentalresultsaregiven.
简介:Micro-structures3-Dprofilemeasurementisanimportantmeasurementcontentforresearchonmicro-machiningandcharacterizationofmicro-dimension.Inthispaper,anewmethodinvolved2-Dstructuretemplate,whichguidesphaseunwrapping,isproposedbasedonphase-shiftingmicroscopicinterferometry.Itisfitnotonlyforstaticmeasurement,butalsofordynamicmeasurement,especiallyformotionofMEMSdevices.3-Dprofileofactivecombofmicro-resonatorisobtainedbyusingthemethod.Thetheoreticprecisioninout-of-planedirectionisbetterthan0.5nm.Thein-planetheoreticprecisioninmicro-structuresisbetterthan0.5μm.Butattheedgeofmicro-structures,itisonthelevelofmicrometermainlycausedbyimpreciseedgeanalysis.Finally,itsdisadvantagesandthefollowingdevelopmentarediscussed.
简介:Awhole-field3Dsurfacemeasurementsystemforsemiconductorwaferinspectionisdescribed.Thesystemconsistsofanopticalfiberplate,whichcansplitthelightbeamintoN2subbeamstorealizethewhole-fieldinspection.Aspecialprismisusedtoseparatetheilluminationlightandsignallight.Thissetupischaracterizedbyhighprecision,highspeedandsimplestructure.