简介:TheXRPD(X-raypowderdiffractometry)patternsofsiliconpowderwithaunitcellstructureofdiamondweredeterminedfrom298to1473K.LatticeparametersofSilinearlyincreasewithtemperature.Thethermalshiftsofthepositionsofallreflectionpeaksarelinearlycorrelatedwiththetemperature.Thecoefficientsoftheintrinsiclinearthermalexpansionandvolumetricthermalexpansionweredeterminedas3.87×10-6/Kand1.16×10-5/Krespectively.ItindicatesthatSiisstillasuitablestandardintheXRPDmethodathightemperatures.
简介:ElectrocrystallizationMechanismofTungsteninMoltenKF-B_2O_3-K_2WO_4WenZhenhuanandLiGuoxun文振环,李国勋(GeneralResearchInstiiuteforNo...