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《同步辐射装置用户科技论文集》
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1998年1期
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X—ray reflectivity and scanning—tunneling—microscopy study of surface roughness scaling of molybdenum films
X—ray reflectivity and scanning—tunneling—microscopy study of surface roughness scaling of molybdenum films
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摘要
未填写
DOI
kd2mlewkj6/1434814
作者
JUNWANG BINGDONG 等
机构地区
不详
出处
《同步辐射装置用户科技论文集》
1998年1期
关键词
钼
表面粗糙度
氧化薄膜
X射线衍射
金属薄片
防锈
分类
[核科学技术][核技术及应用]
出版日期
1998年01月11日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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来源期刊
同步辐射装置用户科技论文集
1998年1期
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相关关键词
钼
表面粗糙度
氧化薄膜
X射线衍射
金属薄片
防锈
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