Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology

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摘要 Thereadoutintegratedcircuit(ROIC)technologyisoneofthecriticaltechnologiesintheresearchofaninfraredfocalplanearray(IRFPA).Basedonthevirtualinstrumenttechnology,asystemforparametertestofROICisdevelopedforIRFPA.Thecomplexprogrammablelogicdevice(CPLD)isappliedintothesystemtoincreaseitsflexibility.Withhighreliabilityandprecision,alongwiththeintegratedsoftwareandhardwareenvironment,thesystemcantestallkindsofROICs.
机构地区 不详
出版日期 2001年03月13日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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