Parameter Test of ROIC for IRFPA Based on Virtual Instrument Technology

(整期优先)网络出版时间:2001-03-13
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Thereadoutintegratedcircuit(ROIC)technologyisoneofthecriticaltechnologiesintheresearchofaninfraredfocalplanearray(IRFPA).Basedonthevirtualinstrumenttechnology,asystemforparametertestofROICisdevelopedforIRFPA.Thecomplexprogrammablelogicdevice(CPLD)isappliedintothesystemtoincreaseitsflexibility.Withhighreliabilityandprecision,alongwiththeintegratedsoftwareandhardwareenvironment,thesystemcantestallkindsofROICs.