Thermal Characterization of 1.3μm InAsP/InGaAsP Ridge Waveguide MQW Lasers Based on I-V Method

(整期优先)网络出版时间:2002-03-13
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AnexperimentalwayforthethermalcharacterizationofsemiconductorlasersbasedonI-Vmethodunderpulsedrivingconditionshasbeendeveloped,withwhichthethermalcharacteristicsofstraincompensated1.3μmInAsP/InGaAsPridgewaveguideMQWlaserchipshavebeeninvestigated.Theresultsshowthat,bymeasuringandanalyzingtheI-Vcharacteristicsunderappropriatepulsedrivingconditionsatdifferentheatsinktemperatures,thethermalresistanceofthelaserdiodescouldbeeasilydeduced.Thedrivingcurrentandjunctionvoltagewaveformsofthelaserchipsunderdifferentpulsedrivingconditionsarealsodiscussed.