THERMAL STRESS MEASUREMENT OF QUARTZ OSCILLATOR MODULE PACKAGING

(整期优先)网络出版时间:2001-03-13
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Thethermalstressofthequartzoscillatormodulepackagingisinvestigatedusingdistal-im-agecorrelationmethod(DICM),andtheexperimentalresultsaregiven.Underthequartzoscillatormodulepackaging,thequartzoscillatorandtheFe-Sn-Cualloyframearejoinedtogetherwiththeelectroconductiveadhesive(PI),andtheelectroconductiveadhesiveneedstobecuredtwiceat150℃and275℃respective-ly.AsthequartzoscillatorandtheFe-Sn-Cualloyframehaveadistinctdifferenceinboththermalexpansioncoefficientsandmechanicalpropertiesandinprocessofpackagingtemperaturerisesordrops,thethermalstressisyieldedeasily.Whiletemperaluredrops,thenormalstressatthequartzoscillatoredgeisatensilestress,whichcanmakethequartzoscillatorfracture.