EMC & EMI

(整期优先)网络出版时间:2005-01-11
/ 1
MostofelectronicsengineershaveexperiencedEMIrelatedissues.IthasbeenunderstandableandacceptabletocomplainabouttheEMIwhenwehavetroubledebuggingourcircuitsorequipment.Peopleliketotreatitasablackboxforthisisagoodexcusetostopusfrominvestigatingwhat'sgoingonbehindthephenomenon.However,thefactisthatwiththeadvancesinmodemmicroelectronics,ithasbeengettingmorechallengingthaneverforelectronicsengineerstoeliminateorreducetheEMIcausedbyhigherfrequencyandhigher-degreeintegration.