Aspectroscopicmethodtodeterminethicknessofquartzwaveplateispresented.Themethodisbasedonchromaticpolarizationinterferometry.Withthepolarization-resolvedtransmissionspectrum(PRTS)curve,thephaseretardationofquartzwaveplatecanbedeterminedatawidespectralrangefrom200to2000nmobviously.ThroughaccuratejudgmentofextremepointsofPRTScurveatlong-waveband,thephysicalthicknessofquartzwaveplatescanbeobtainedexactly.Wegiveameasuringexampleandtheerroranalysis.Itisfoundthatthemeasuringprecisionofthicknessismainlydeterminedbythespectralresolutionofspectrometer.
