简介:Thisarticlebringsupsomeexplanationsandclarificationsabouttwicedepositionofleadiodidewritteninthepreviousarticle[1],afterlookingintothetwicedepositionofleadiodideandcarryingontheimprovingbyalayerofPbBr2insteadofPbI2,theshortcircuitcurrentdensity(Jsc)hasdecreased,allowingtoexplainthetwicedepositionis,infact,onedeposition.Theabsorbanceofperovskitewillbediscussed.Thesubstratetemperatureisthemostimportantparameterbecauseitcanimprovetheefficiencyoftheperovskitesolarcells,thesubstratetemperatureshouldbeabout100°Catthedepositionofleadiodide,andwhenthedepositionofmethylammoniumiodideisdonewhenthesubstrateisstillhot,theefficiencyisalsoimproved.Thetemperatureduringthepreparationislessimportantthanthehumidity,butthepreparationinthegloveboxallowsthattheenvironmentalconditionsbecontrolled.
简介:Depositionoftwo-dimensional(2D)MoS2materialsonthetaperedfiberallowsvariousphotonicapplicationsincludingsaturableabsorbersandfour-wavemixing.Ethanolcatalyticdeposition(ECD)ofMoS2ontheopticaltaperedfiberwasproposedanddemonstratedinthiswork.Differentfromtheconventionalopticaldrivendepositionusingwaterororganicsolvent,theECDmethodutilizedthehighvolatilityoftheethanolsolvent,whichsignificantlyincreasedthemovementspeedoftheMoS2nanosheetsandthusboostedthedepositionrateandreducedtheminimumpowerthresholdtodrivethedeposition.WebelievetheECDmethodshouldbeabletobeappliedtoothersimilar2Dmaterialssuchasothertypesoftransitionmetalchalcogenides.
简介:Thispaperpresentsamethodusingsimplephysicalvapourdepositiontoformhigh-qualityhafniumsiliconoxyni-tride(HfSiON)onultrathinSiO2bufferlayer.Thegatedielectricwith10A(1A=0.1nm)equivalentoxidethicknessisobtained.TheexperimentalresultsindicatethatthepreparedHfSiONgatedielectricexhibitsgoodphysicalandelectricalcharacteristics,includingverygoodthermalstabilityupto1000C,excellentinterfaceproperties,highdielectricconstant(k=14)andlowgate-leakagecurrent(Ig=1.9×103A/cm2@Vg=Vfb1VforEOTof10A).TaNmetalgateelectrodeisintegratedwiththeHfSiONgatedielectric.TheeffectiveworkfunctionofTaNonHfSiONis4.3eV,meetingtherequirementsofNMOSforthemetalgate.And,theimpactsofsputteringambientandannealingtemperatureontheelectricalpropertiesofHfSiONgatedielectricareinvestigated.
简介:WehavestudiedtheinterfacialstructuresofAlN/Si(111)grownbymetal-organicchemicalvapourdeposition.X-rayphotoelectronspectroscopyandAngerelectronspectroscopywereusedtoanalysethecomponentsandchemicalstructuresofAlN/Si(111).Theresultsindicatedthatamix-crystaltransitionregion,approximately12nm,waspresentbetweentheAlNfilmandtheSisubstrateanditwascomposedofAlNandSi3N4.AfteranalysiswefoundthattheexistenceofSi3N4couldnotbeavoidedintheAlN/Si(111)interfacebecauseofstrongdiffusionat1070℃.EveninAlNlayerSi-Nbonds,Si-Sibondscanbefound.
简介:Bariumferrite(BaM)thinfilmsaredepositedonplatinumcoatedsiliconwafersbypulsedlaserdeposition(PLD).Theeffectsofdepositionsubstratetemperatureonthemicrostructure,magneticandmicrowavepropertiesofBaMthinfilmsareinvestigatedindetail.Itisfoundthatmicrostructure,magneticandmicrowavepropertiesofBaMthinfilmareverysensitivetodepositionsubstratetemperature,andexcellentBaMthinfilmisobtainedwhendepositiontemperatureis910℃andoxygenpressureis300mTorr(1Torr=1.3332×102Pa).X-raydiffractionpatternsandatomicforcemicroscopyimagesshowthatthebestthinfilmhasperpendicularorientationandhexagonalmorphology,andthecrystallographicalignmentdegreecanbecalculatedtobe0.94.Hysteresisloopsrevealthatthesquarenessratio(Mr/Ms)isashighas0.93,thesaturatedmagnetizationis4004Gs(1Gs=104T),andtheanisotropyfieldis16.5kOe(1Oe=79.5775A·m-1).Ferromagneticresonancemeasurementsrevealthatthegyromagneticratiois2.8GHz/kOe,andtheferromagneticresonancelinewithis108Oeat50GHz,whichmeansthatthisthinfilmhaslowmicrowaveloss.ThesepropertiesmaketheBaMthinfilmshavepotentialapplicationsinmicrowavedevices.
简介:Thetransportofablatedparticlesproducedbysinglepulsed-laserablationissimulatedviaMonteCarlomethod.Thepressurerangesofvelocitysplittingofablatedparticlesindifferentinertgasesareinvestigated.Theresultshowsthattherangeofvelocitysplittingdecreaseswiththeatomicmassoftheambientgasincreasing.TheambientgaswhoseatomicmassismorethanthatofKrcannotinducethevelocitysplittingofablatedparticles.Theresultsareexplainedbytheunderdampingmodelandtheinertiaflowmodel.
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简介:TheBrenner-LJpotentialisadoptedtodescribetheinteractionbetweenC36clustersanddiamondsurface,andthedepositionmechanismofmulti-C36clustersonthediamondsurfaceisalsostudiedbyusingthemethodofmoleculardynamicssimulation.Thesimulationresultsshowthatthecompetitioneffectsoftwointeractions,i.e.theinteractionbetweenclusterandclusterandtheinteractionbetweenclusterandcrystalplane,arestudied,andthentheinfluenceofthesecompetitioneffectsonC36clusterdepositionisanalysed.Thefindingisthatwhenanincidentenergyisappropriatelychosen,C36clusterscanbechemicallyadsorbedanddepositedsteadilyonthediamondsurfaceintheformofsingle-layer,andinthedepositionprocessthemulti-C36clusterspresentaphenomenonofenergytransmission.Theexperimentalresultshowsthatatatemperatureof300K,inordertodepositC36clustersintoasteadynano-structuredsingle-layeredfilm,theoptimalincidentenergyisbetween10and18eV,iftheincidentenergyislargerthan18eV,theC36clusterswillbedepositedintoanislandnano-structuredfilm.
简介:AtomicallythinMoS2filmshaveattractedsignificantattentionduetoexcellentelectricalandopticalproperties.Thedevelopmentofdeviceapplicationsdemandstheproductionoflarge-areathinfilmwhichisstillanobstacle.Inthisworkwedevelopedafacilemethodtodirectlygrowlarge-areaMoS2thinfilmonSiO2substrateviaambientpressurechemicalvapordepositionmethod.Thecharacterizationsbyspectroscopyandelectronmicroscopyrevealthattheas-grownMoS2filmismainlybilayerandtrilayerwithhighquality.Back-gatefield-effecttransistorbasedonsuchMoS2thinfilmshowscarriermobilityupto3.4cm2V-1s-1andon/offratioof105.Thelarge-areaatomicallythinMoS2preparedinthisworkhasthepotentialforwideoptoelectronicandphotonicdeviceapplications.
简介:Rhodium-andironphosphate-basedcatalystsarebyfarthemostpromisingcatalystsforoxy-brominationofmethane(OBM)reaction.However,mostliteraturereportedeitherRh-orFePO4-basedcatalysts,andtheresultswererarelystudiedinauniformenvironmentalcondition.Inthisreport,comparativestudywasconductedonsilica-andsiliconcarbide-supportedrhodiumandironphosphatecatalystswiththemainfocusesonstabilityperformanceandcokedeposition.ThecatalyticresultsdemonstratedthatthestabilityofbothRh-andFePO4-basedcatalystswasgreatlyinfluencedbythesupportsused,andsiliconcarbide-supportedcatalystsshowedmuchbetteranti-cokingabilityascomparedwithsilica-supportedones.Temperature-programmedoxidationovertheusedcatalystsfurtherindicatedthatthecokeformationmechanismswerecompletelydifferentbetweensilica-supportedrhodiumandironphosphatecatalysts.WhilecokesmightbecausedbycondensationofCH2Br2oversupportedironphosphate,methanedecompositionmightbethereasonforcokeformationoversilica-supportedrhodiumcatalyst.ThesefindingsmightpavethewayfordesigninghighlyefficientandstablecatalystsoftheOBMreaction.
简介:OnaccountoftheexcellentmechanicalpropertiesofCrNfilmsuchasgoodwearandcorrosionresistance,andoxidizationatamuchhighertemperature,CrNfilmhasbeendemonstratedasoneofthebestcoatingsforenlargingthebearingatpresent.However,steelworkinglifespanatpresentt.However,withthemoreincreasinglyaggressiveoftheworkingenvironmentofmechanicalcomponents,especiallyforbearingsteel,newcoatingtechnologieswithamorebetterpropertiesofthetreatedpartssuchaswearandcorrosionresistancearerequired.
简介:Wedemonstratelow-losshydrogenatedamorphoussilicon(a-Si:H)waveguidesbyhot-wirechemicalvapordeposition(HWCVD).Theeffectofhydrogenationina-SiatdifferentdepositiontemperatureshasbeeninvestigatedandanalyzedbyRamanspectroscopy.Weobtainedanopticalqualitya-Si:Hwaveguidedepositedat230°CthathasastrongRamanpeakshiftat480cm-1,peakwidth(fullwidthathalf-maximum)of68.9cm-1,andbondangledeviationof8.98°.Opticaltransmissionmeasurementshowsalowpropagationlossof0.8dB/cmatthe1550nmwavelength,whichisthefirst,toourknowledge,reportforaHWCVDa-Si:Hwaveguide.
简介:WereportonN-dopedp-typeZnOfilmswiththec-axisparalleltothesubstrate.ZnOfilmswerepreparedonana-Al2O3(0001)substratebysolid-sourcechemicalvapourdeposition(CVD),Zn(CH3COO)2.2H2OwasusedastheprecursorandCH3COONH4asthenitrogensource.Thegrowthtemperaturewasvariedfrom300℃to600℃,theas-grownZnOfilmdepositedat500℃showedp-typeconductionwithitsresistivityof42Ωcm,carrierdensity3.7×10^17cm^-3andHallmobility1.26cm^2V^-1.s^-1atroomtemperature,whicharethebestpropertiesforp-typeZnOdepositedbyCVD.Thep-typeZnOfilmpossessesatransmittanceofabout85%inthevisibleregionandabandgapof3.21eVatroomtemperature.
简介:ThisstudyshowsthepreparationofaTiO_2coatedPt/C(TiO_2/Pt/C)byatomiclayerdeposition(ALD),andtheexaminationofthepossibilityforTiO_2/Pt/Ctobeusedasadurablecathodecatalystinpolymerelectrolytefuelcells(PEFCs).CyclicvoltammetryresultsrevealedthatTiO_2/Pt/Ccatalystwhichhas2nmprotectivelayershowedsimilaractivityfortheoxygenreductionreactioncomparedtoPt/Ccatalystsandtheyalsohadgooddurability.TiO_2/Pt/Cpreparedby10ALDcyclesdegraded70%after2000Accelerateddegradationtest,whilePt/Ccorroded92%inthesameconditions.TiO_2ultrathinlayerbyALDisabletoachieveagoodbalancebetweenthedurabilityandactivity,leadingtoTiO_2/Pt/CasapromisingcathodecatalystforPEFCs.ThemechanismoftheTiO_2protectivelayerusedtopreventthedegradationofPt/Cisdiscussed.