简介:Insomesituations,theacceleratedlifetestonenvironmentalstressforelectronicproductsisnoteasilyimplementedduetovariousrestrictions,andthusengineersarelackingofdataoftheproductlifetest.Concerningthisproblem,environmentallifeoftheprintedcircuitboard(PCB)boardiscalculatedbywayofphysicsoffailure.InfluencesofthermalcycleandvibrationonPCBanditscomponentsarestudied.BasedontheanalysisofforceandstressbetweencomponentsandthePCBboardinthermalcycleeventsandvibrationevents,fourlifecomputingmodelsofpinsandsoldereddotsareestablished.Themillerdamageratioisusedtocalculatetheaccumulateddamageofapinorasoldereddot,andthentheenvironmentlifeofthePCBboardcanbedeterminedbythefirstfailedone.Finally,anexampleisusedtoillustratethemodelsandtheircalculations.
简介:ThelifeofimpregnatedBa-Wcathodeswithanewconstructionhavebeenevaluatedusinganacceleratedlifetestatthreedifferenttemperatures(1170℃,1130℃,1090℃)andconstantcurrentdensity(2A/cm~2).Accordingtotherelationshipoflifewithoperatingtemperatures,anacceleratedequationhasbeensetup.Thecathodelifeatnormaloperatingtemperatureisdeductedbasedontheacceleratedequation.Theresultsshowthatlifeofthenovelcathodeexceeds190,000houratacurrentdensityof2A/cm~2.
简介:UnderType-IIprogressivelyhybridcensoring,thispaperdiscussesstatisticalinferenceandoptimaldesignonstepstresspartiallyacceleratedlifetestforhybridsysteminpresenceofmaskeddata.ItisassumedthatthelifetimeofthecomponentinhybridsystemsfollowsindependentandidenticalmodifiedWeibulldistributions.Themaximumlikelihoodestimations(MLEs)oftheunknownparameters,accelerationfactorandreliabilityindexesarederivedbyusingtheNewton-Raphsonalgorithm.Theasymptoticvariance-covariancematrixandtheapproximateconfidenceintervalsareobtainedbasedonnormalapproximationtotheasymptoticdistributionofMLEsofmodelparameters.Moreover,twobootstrapconfidenceintervalsareconstructedbyusingtheparametricbootstrapmethod.TheoptimaltimeofchangingstresslevelsisdeterminedunderD-optimalityandA-optimalitycriteria.Finally,theMonteCarlosimulationstudyiscarriedouttoillustratetheproposedprocedures.